LEADER 01797oam  2200457zu 450 
001 9910138915303321
005 20241212215829.0
010   $a9781509069293
010   $a1509069291
010   $a9781424442065
010   $a1424442060
035   $a(CKB)2400000000003075
035   $a(SSID)ssj0000453088
035   $a(PQKBManifestationID)12171165
035   $a(PQKBTitleCode)TC0000453088
035   $a(PQKBWorkID)10488686
035   $a(PQKB)11323796
035   $a(NjHacI)992400000000003075
035   $a(EXLCZ)992400000000003075
100   $a20160829d2009      uy 
101 0 $aeng
135   $aur|||||||||||
181   $ctxt
182   $cc
183   $acr
200 10$a2009 10th Latin American Test Workshop
210 31$a[Place of publication not identified]$cIEEE$d2009
215   $a1 online resource (221 pages)
300   $aBibliographic Level Mode of Issuance: Monograph
311 08$a9781424442072 
311 08$a1424442079 
330   $aThe stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault.
606   $aElectronic apparatus and appliances$xTesting$vCongresses
615  0$aElectronic apparatus and appliances$xTesting
676   $a621.3810287
702   $aIEEE Staff
801  0$bPQKB
906   $aPROCEEDING
912   $a9910138915303321
996   $a2009 10th Latin American Test Workshop$92546654
997   $aUNINA