01797oam 2200457zu 450 991013891530332120241212215829.09781509069293150906929197814244420651424442060(CKB)2400000000003075(SSID)ssj0000453088(PQKBManifestationID)12171165(PQKBTitleCode)TC0000453088(PQKBWorkID)10488686(PQKB)11323796(NjHacI)992400000000003075(EXLCZ)99240000000000307520160829d2009 uy engur|||||||||||txtccr2009 10th Latin American Test Workshop[Place of publication not identified]IEEE20091 online resource (221 pages)Bibliographic Level Mode of Issuance: Monograph9781424442072 1424442079 The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology [1-3]. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and/or source. This defect defies a guaranteed 100% detection. We will show that this mostly discarded failure mechanism is very relevant to modern ICs. Current leakage in nanoscale technologies influence significantly the behavior of this fault.Electronic apparatus and appliancesTestingCongressesElectronic apparatus and appliancesTesting621.3810287IEEE StaffPQKBPROCEEDING99101389153033212009 10th Latin American Test Workshop2546654UNINA