2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE)
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| Titolo: |
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE)
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020 |
| Descrizione fisica: | 1 online resource : illustrations some color |
| Disciplina: | 004.2 |
| Soggetto topico: | Integrated circuits - Fault tolerance |
| Nanotechnology | |
| Conference papers and proceedings | |
| Altri titoli varianti: | 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems |
| Titolo autorizzato: | 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) |
| ISBN: | 1-7281-9457-1 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910437213503321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |