LEADER 01488nam  2200385   450 
001 9910437213503321
005 20230414134252.0
010   $a1-7281-9457-1
035   $a(CKB)5590000000006288
035   $a(NjHacI)995590000000006288
035   $a(EXLCZ)995590000000006288
100   $a20230414d2020      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$a2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) /$fInstitute of Electrical and Electronics Engineers (IEEE)
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers (IEEE),$d2020.
215   $a1 online resource $cillustrations some color
311   $a1-7281-9458-X 
517   $a2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 
606   $aIntegrated circuits$xFault tolerance
606   $aNanotechnology$vCongresses
606   $aConference papers and proceedings
615  0$aIntegrated circuits$xFault tolerance.
615  0$aNanotechnology
615  0$aConference papers and proceedings.
676   $a004.2
801  0$bNjHacI
801  1$bNjHacl
906   $aPROCEEDING
912   $a9910437213503321
996   $a2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)$92544914
997   $aUNINA