01488nam 2200385 450 991043721350332120230414134252.01-7281-9457-1(CKB)5590000000006288(NjHacI)995590000000006288(EXLCZ)99559000000000628820230414d2020 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) /Institute of Electrical and Electronics Engineers (IEEE)Piscataway, New Jersey :Institute of Electrical and Electronics Engineers (IEEE),2020.1 online resource illustrations some color1-7281-9458-X 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Integrated circuitsFault toleranceNanotechnologyCongressesConference papers and proceedingsIntegrated circuitsFault tolerance.NanotechnologyConference papers and proceedings.004.2NjHacINjHaclPROCEEDING99104372135033212020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2544914UNINA