1.

Record Nr.

UNINA9910437213503321

Titolo

2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE)

Pubbl/distr/stampa

Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020

ISBN

1-7281-9457-1

Descrizione fisica

1 online resource : illustrations some color

Disciplina

004.2

Soggetti

Integrated circuits - Fault tolerance

Nanotechnology

Conference papers and proceedings

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia