Semiconductor devices in harsh conditions / / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski
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| Titolo: |
Semiconductor devices in harsh conditions / / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski
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| Pubblicazione: | Boca Raton : , : CRC Press, , [2017] |
| ©2017 | |
| Edizione: | 1st ed. |
| Descrizione fisica: | 1 online resource (257 pages) |
| Disciplina: | 621.3815/2 |
| Soggetto topico: | Semiconductors - Reliability |
| Extreme environments | |
| Environmental testing | |
| Persona (resp. second.): | Chrzanowska-JeskeMalgorzata |
| Weide-ZaageKirsten | |
| Nota di bibliografia: | Includes bibliographical references at the end of each chapters and index. |
| Nota di contenuto: | section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design. |
| Sommario/riassunto: | The book focuses on radiation, operating conditions, sensor systems, and package and system design. |
| Titolo autorizzato: | Semiconductor devices in harsh conditions |
| ISBN: | 1-315-35194-3 |
| 1-315-36894-3 | |
| 1-4987-4382-X | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910153183603321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |
Serie:
Devices, circuits, and systems.