01710oam 2200505I 450 991015318360332120230810001430.01-315-35194-31-315-36894-31-4987-4382-X10.1201/9781315368948 (CKB)3710000000960827(MiAaPQ)EBC4748374(OCoLC)966358842(EXLCZ)99371000000096082720180706h20172017 uy 0engurcnu||||||||rdacontentrdamediardacarrierSemiconductor devices in harsh conditions /edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof IniewskiBoca Raton :CRC Press,[2017]©20171 online resource (257 pages)Devices, Circuits, and Systems1-4987-4380-3 Includes bibliographical references at the end of each chapters and index.section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.Devices, circuits, and systems.SemiconductorsReliabilityExtreme environmentsEnvironmental testingSemiconductorsReliability.Extreme environments.Environmental testing.621.3815/2Chrzanowska-Jeske MalgorzataWeide-Zaage KirstenFlBoTFGFlBoTFGBOOK9910153183603321Semiconductor devices in harsh conditions2287503UNINA