|
|
|
|
|
|
|
|
1. |
Record Nr. |
UNINA9910153183603321 |
|
|
Titolo |
Semiconductor devices in harsh conditions / / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski |
|
|
|
|
|
|
|
Pubbl/distr/stampa |
|
|
Boca Raton : , : CRC Press, , [2017] |
|
©2017 |
|
|
|
|
|
|
|
|
|
ISBN |
|
1-315-35194-3 |
1-315-36894-3 |
1-4987-4382-X |
|
|
|
|
|
|
|
|
Descrizione fisica |
|
1 online resource (257 pages) |
|
|
|
|
|
|
Collana |
|
Devices, Circuits, and Systems |
|
|
|
|
|
|
Disciplina |
|
|
|
|
|
|
Soggetti |
|
Semiconductors - Reliability |
Extreme environments |
Environmental testing |
|
|
|
|
|
|
|
|
Lingua di pubblicazione |
|
|
|
|
|
|
Formato |
Materiale a stampa |
|
|
|
|
|
Livello bibliografico |
Monografia |
|
|
|
|
|
Nota di bibliografia |
|
Includes bibliographical references at the end of each chapters and index. |
|
|
|
|
|
|
|
|
Nota di contenuto |
|
section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design. |
|
|
|
|
|
|
|