Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / / Jon Geist; M. Yaqub Afridi
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| Autore: |
Geist Jon
|
| Titolo: |
Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / / Jon Geist; M. Yaqub Afridi
|
| Pubblicazione: | Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015 |
| Descrizione fisica: | 1 online resource (39 pages) : illustrations (color) |
| Soggetto topico: | Data collection systems |
| Frequencies of oscillating systems | |
| Altri autori: |
AfridiM. Yaqub
GeistJon
|
| Note generali: | Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. |
| July 2015. | |
| Title from PDF title page (viewed July 30, 2015). | |
| Nota di bibliografia: | Includes bibliographical references. |
| Altri titoli varianti: | Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 |
| Titolo autorizzato: | Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910709597103321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |