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Record Nr. |
UNINA9910709597103321 |
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Autore |
Geist Jon |
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Titolo |
Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 : frequency offset, random, quantization, and jitter noise / / Jon Geist; M. Yaqub Afridi |
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Pubbl/distr/stampa |
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Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 2015 |
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Descrizione fisica |
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1 online resource (39 pages) : illustrations (color) |
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Collana |
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Altri autori (Persone) |
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Soggetti |
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Data collection systems |
Frequencies of oscillating systems |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes. |
July 2015. |
Title from PDF title page (viewed July 30, 2015). |
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Nota di bibliografia |
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Includes bibliographical references. |
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