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035   $a(OCoLC)921893552
035   $a(EXLCZ)995470000002479025
100   $a20150922d2015      ua             0
101 0 $aeng
181   $2rdacontent
182   $2rdamedia
183   $2rdacarrier
200 10$aSimulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1$efrequency offset, random, quantization, and jitter noise /$fJon Geist; M. Yaqub Afridi
210  1$aGaithersburg, MD :$cU.S. Dept. of Commerce, National Institute of Standards and Technology,$d2015.
215   $a1 online resource (39 pages) $cillustrations (color)
225 1 $aNISTIR ;$v8073
300   $aContributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
300   $aJuly 2015.
300   $aTitle from PDF title page (viewed July 30, 2015).
320   $aIncludes bibliographical references.
517   $aSimulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 
606   $aData collection systems
606   $aFrequencies of oscillating systems
615  0$aData collection systems.
615  0$aFrequencies of oscillating systems.
700   $aGeist$b Jon$01392974
701   $aAfridi$b M. Yaqub$01392975
701   $aGeist$b Jon$01392974
712 02$aPhysical Measurement Laboratory (National Institute of Standards and Technology (U.S.)).$bSemiconductor and Dimensional Metrology Division.
801  0$bNBS
801  1$bNBS
801  2$bGPO
906   $aBOOK
912   $a9910709597103321
996   $aSimulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1$93448517
997   $aUNINA