00754nam0-22002771i-450-9900031914304033210-916354-23-7000319143FED01000319143(Aleph)000319143FED0100031914320000920d--------km-y0itay50------baitaITSex DifferencesCultural and Developmental DimensionsPatrick C. Lee, Robert Sussman Stewart, Editors15410Lee,Patrick C.Sussman Stewart,RobertITUNINARICAUNIMARCBK99000319143040332115410 LEE8396/ISESSESSex Differences453684UNINAING0101976aam 2200445I 450 991070959710332120260324164323.0GOVPUB-C13-79c5d97348df3788da6e3bb03483127e(CKB)5470000002479025(OCoLC)921893552(EXLCZ)99547000000247902520150922d2015 ua 0engrdacontentrdamediardacarrierSimulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1frequency offset, random, quantization, and jitter noise /Jon Geist; M. Yaqub AfridiGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2015.1 online resource (39 pages) illustrations (color)NISTIR ;8073Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.July 2015.Title from PDF title page (viewed July 30, 2015).Includes bibliographical references.Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1Data collection platformsFrequencies of oscillating systemsData collection platforms.Frequencies of oscillating systems.Geist Jon1392974Afridi M. Yaqub1392975Geist Jon1392974Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.)).Semiconductor and Dimensional Metrology Division.NBSNBSGPOBOOK9910709597103321Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 13448517UNINA