01977aam 2200445I 450 991070959710332120150922044127.0GOVPUB-C13-79c5d97348df3788da6e3bb03483127e(CKB)5470000002479025(OCoLC)921893552(EXLCZ)99547000000247902520150922d2015 ua 0engrdacontentrdamediardacarrierSimulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1frequency offset, random, quantization, and jitter noise /Jon Geist; M. Yaqub AfridiGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2015.1 online resource (39 pages) illustrations (color)NISTIR ;8073Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.July 2015.Title from PDF title page (viewed July 30, 2015).Includes bibliographical references.Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 1 Data collection systemsFrequencies of oscillating systemsData collection systems.Frequencies of oscillating systems.Geist Jon1392974Afridi M. Yaqub1392975Geist Jon1392974Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.)).Semiconductor and Dimensional Metrology Division.NBSNBSGPOBOOK9910709597103321Simulated sinewave testing of data acquisition systems using sine fitting and discrete fourier transform methods part 13448517UNINA