2013 8th IEEE Design and Test Symposium / / Institute of Electrical and Electronics Engineers
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| Titolo: |
2013 8th IEEE Design and Test Symposium / / Institute of Electrical and Electronics Engineers
|
| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2013 |
| Descrizione fisica: | 1 online resource : illustrations |
| Disciplina: | 621 |
| Soggetto topico: | Electronic circuit design |
| Integrated circuits - Testing | |
| Electronic circuits - Testing | |
| Sommario/riassunto: | The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. |
| Altri titoli varianti: | Design and Test Symposium |
| Titolo autorizzato: | 2013 8th IEEE Design and Test Symposium |
| ISBN: | 1-4799-3525-5 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910132411103321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |