LEADER 01737nam 2200397 450 001 9910132411103321 005 20230424180829.0 010 $a1-4799-3525-5 035 $a(CKB)3460000000126181 035 $a(NjHacI)993460000000126181 035 $a(EXLCZ)993460000000126181 100 $a20230424d2013 uy 0 101 0 $aeng 135 $aur||||||||||| 181 $ctxt$2rdacontent 182 $cc$2rdamedia 183 $acr$2rdacarrier 200 10$a2013 8th IEEE Design and Test Symposium /$fInstitute of Electrical and Electronics Engineers 210 1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers (IEEE),$d2013. 215 $a1 online resource $cillustrations 311 $a1-4799-3526-3 330 $aThe International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region. 517 $aDesign and Test Symposium 606 $aElectronic circuit design$vCongresses 606 $aIntegrated circuits$xTesting$vCongresses 606 $aElectronic circuits$xTesting$vCongresses 615 0$aElectronic circuit design 615 0$aIntegrated circuits$xTesting 615 0$aElectronic circuits$xTesting 676 $a621 801 0$bNjHacI 801 1$bNjHacl 906 $aPROCEEDING 912 $a9910132411103321 996 $a2013 8th IEEE Design and Test Symposium$92544567 997 $aUNINA