01737nam 2200397 450 991013241110332120230424180829.01-4799-3525-5(CKB)3460000000126181(NjHacI)993460000000126181(EXLCZ)99346000000012618120230424d2013 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2013 8th IEEE Design and Test Symposium /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :Institute of Electrical and Electronics Engineers (IEEE),2013.1 online resource illustrations1-4799-3526-3 The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region.Design and Test Symposium Electronic circuit designCongressesIntegrated circuitsTestingCongressesElectronic circuitsTestingCongressesElectronic circuit designIntegrated circuitsTestingElectronic circuitsTesting621NjHacINjHaclPROCEEDING99101324111033212013 8th IEEE Design and Test Symposium2544567UNINA