1.

Record Nr.

UNINA9910132411103321

Titolo

2013 8th IEEE Design and Test Symposium / / Institute of Electrical and Electronics Engineers

Pubbl/distr/stampa

Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2013

ISBN

1-4799-3525-5

Descrizione fisica

1 online resource : illustrations

Disciplina

621

Soggetti

Electronic circuit design

Integrated circuits - Testing

Electronic circuits - Testing

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Sommario/riassunto

The International Design and Test Symposium explores emerging challenges and novel concepts in design, automation, test and reliability of electronic products ranging from integrated circuits through multi chip modules and printed circuit boards to full systems and microsystems IDT provides unique forum to discuss best practices and novel ideas in design methods, tools, test and reliability in the Middle East and Africa (MEA) region.