1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE
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| Titolo: |
1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE
|
| Pubblicazione: | New York : , : IEEE, , 2022 |
| Descrizione fisica: | 1 online resource (168 pages) |
| Disciplina: | 621.3815 |
| Soggetto topico: | Integrated circuits - Testing |
| Embedded computer systems - Testing | |
| Systems on a chip - Testing - Standards | |
| Sommario/riassunto: | A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators. |
| Titolo autorizzato: | 1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits |
| ISBN: | 1-5044-8866-0 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996574994103316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |