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Record Nr. |
UNISA996574994103316 |
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Titolo |
1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits / / IEEE |
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Pubbl/distr/stampa |
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New York : , : IEEE, , 2022 |
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ISBN |
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Descrizione fisica |
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1 online resource (168 pages) |
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Disciplina |
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Soggetti |
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Integrated circuits - Testing |
Embedded computer systems - Testing |
Systems on a chip - Testing - Standards |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Sommario/riassunto |
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A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators. |
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