01501nam 2200385 450 99657499410331620231214123449.01-5044-8866-010.1109/IEEESTD.2022.9916221(CKB)4100000012897136(NjHacI)994100000012897136(EXLCZ)99410000001289713620231214d2022 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier1500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits /IEEENew York :IEEE,2022.1 online resource (168 pages)A mechanism for the test of core designs within a system on chip (SoC) is defined. This mechanism is a hardware architecture and the core test language (CTL) is leveraged to facilitate communication between core designers and core integrators.Integrated circuitsTestingEmbedded computer systemsTestingSystems on a chipTestingStandardsIntegrated circuitsTesting.Embedded computer systemsTesting.Systems on a chipTestingStandards.621.3815NjHacINjHaclDOCUMENT9965749941033161500-2022 - IEEE Standard Testability Method for Embedded Core-based Integrated Circuits3882316UNISA