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Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On



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Titolo: Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On Visualizza cluster
Pubblicazione: [Place of publication not identified], : IEEE Computer Society Press, 1994
Descrizione fisica: 1 online resource (304 pages)
Disciplina: 004.2
Soggetto topico: Fault-tolerant computing
Integrated circuits - Very large scale integration - Design and construction
Note generali: Bibliographic Level Mode of Issuance: Monograph
Sommario/riassunto: Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright by Book News, Inc., Portland, OR.
Titolo autorizzato: Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On  Visualizza cluster
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 996198229503316
Lo trovi qui: Univ. di Salerno
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