Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On

• Record Nr.: UNISA996198229503316
• Pubbl/distr/stampa: [Place of publication not identified], : IEEE Computer Society Press, 1994
• Descrizione fisica: 1 online resource (304 pages)
• Disciplina: 004.2
• Soggetti: Fault-tolerant computing; Integrated circuits - Very large scale integration - Design and construction
• Lingua di pubblicazione: Inglese
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Note generali: Bibliographic Level Mode of Issuance: Monograph
• Sommario/riassunto: Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright by Book News, Inc., Portland, OR.