01791oam 2200409zu 450 99619822950331620210807003406.0(CKB)111026746738638(SSID)ssj0000558189(PQKBManifestationID)12189215(PQKBTitleCode)TC0000558189(PQKBWorkID)10558258(PQKB)11553872(NjHacI)99111026746738638(EXLCZ)9911102674673863820160829d1994 uy engur|||||||||||txtccrDefect and Fault-Tolerance in VLSI Systems, 1994 Workshop On[Place of publication not identified]IEEE Computer Society Press19941 online resource (304 pages)Bibliographic Level Mode of Issuance: Monograph0-8186-6307-3 Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright by Book News, Inc., Portland, OR.Fault-tolerant computingCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesFault-tolerant computingIntegrated circuitsVery large scale integrationDesign and construction004.2PQKBBOOK996198229503316Defect and Fault-Tolerance in VLSI Systems, 1994 Workshop On2531429UNISA