IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society
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| Titolo: |
IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
| Descrizione fisica: | 1 online resource (69 pages) |
| Disciplina: | 621.3815 |
| Soggetto topico: | Semiconductors - Reliability |
| Integrated circuits - Wafer-scale integratio - Reliability | |
| Integrated circuits - Reliability | |
| Titolo autorizzato: | IIRW |
| ISBN: | 1-5386-6039-3 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910326259803321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |