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Record Nr. |
UNINA9910326259803321 |
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Titolo |
IIRW : 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 / / sponsored by the Electron Devices Society and the IEEE Reliability Society |
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Pubbl/distr/stampa |
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Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2018 |
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ISBN |
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Descrizione fisica |
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1 online resource (69 pages) |
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Disciplina |
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Soggetti |
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Semiconductors - Reliability |
Integrated circuits - Wafer-scale integratio - Reliability |
Integrated circuits - Reliability |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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