01482nam 2200397 450 991032625980332120230814233124.01-5386-6039-3(CKB)4100000008402001(WaSeSS)IndRDA00122767(EXLCZ)99410000000840200120200509d2018 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierIIRW 2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 /sponsored by the Electron Devices Society and the IEEE Reliability SocietyPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2018.1 online resource (69 pages)1-5386-6040-7 SemiconductorsReliabilityCongressesIntegrated circuitsWafer-scale integratioReliabilityCongressesIntegrated circuitsReliabilityCongressesSemiconductorsReliabilityIntegrated circuitsWafer-scale integratioReliabilityIntegrated circuitsReliability621.3815IEEE Electron Devices Society,IEEE Reliability Society,WaSeSSWaSeSSPROCEEDING9910326259803321IIRW2520485UNINA