LEADER 01482nam  2200397   450 
001 9910326259803321
005 20230814233124.0
010   $a1-5386-6039-3
035   $a(CKB)4100000008402001
035   $a(WaSeSS)IndRDA00122767
035   $a(EXLCZ)994100000008402001
100   $a20200509d2018      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aIIRW $e2018 IEEE International Integrated Reliability Workshop : Stanford Sierra Conference Center, South Lake Tahoe, CA, USA, October 7-11, 2018 /$fsponsored by the Electron Devices Society and the IEEE Reliability Society
210  1$aPiscataway, New Jersey :$cInstitute of Electrical and Electronics Engineers,$d2018.
215   $a1 online resource (69 pages)
311   $a1-5386-6040-7 
606   $aSemiconductors$xReliability$vCongresses
606   $aIntegrated circuits$xWafer-scale integratio$xReliability$vCongresses
606   $aIntegrated circuits$xReliability$vCongresses
615  0$aSemiconductors$xReliability
615  0$aIntegrated circuits$xWafer-scale integratio$xReliability
615  0$aIntegrated circuits$xReliability
676   $a621.3815
712 02$aIEEE Electron Devices Society,
712 02$aIEEE Reliability Society,
801  0$bWaSeSS
801  1$bWaSeSS
906   $aPROCEEDING
912   $a9910326259803321
996   $aIIRW$92520485
997   $aUNINA