2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
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| Titolo: |
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
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| Pubblicazione: | [Place of publication not identified], : IEEE, 2007 |
| Soggetto topico: | Integrated circuits - Testing |
| Semiconductors - Testing | |
| Electronic apparatus and appliances - Testing | |
| Electrical & Computer Engineering | |
| Engineering & Applied Sciences | |
| Electrical Engineering | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | 2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan |
| ISBN: | 9781509082698 |
| 1509082697 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910143014603321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |