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Record Nr. |
UNINA9910143014603321 |
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Titolo |
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan |
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Pubbl/distr/stampa |
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[Place of publication not identified], : IEEE, 2007 |
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ISBN |
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Soggetti |
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Integrated circuits - Testing |
Semiconductors - Testing |
Electronic apparatus and appliances - Testing |
Electrical & Computer Engineering |
Engineering & Applied Sciences |
Electrical Engineering |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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Note generali |
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Bibliographic Level Mode of Issuance: Monograph |
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