02040oam 2200541zu 450 991014301460332120241212215515.097815090826981509082697(CKB)1000000000331428(SSID)ssj0000395466(PQKBManifestationID)12171114(PQKBTitleCode)TC0000395466(PQKBWorkID)10454138(PQKB)10368537(EXLCZ)99100000000033142820160829d2007 uy engtxtccr2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan[Place of publication not identified]IEEE2007Bibliographic Level Mode of Issuance: Monograph9781424407804 142440780X 9781424407811 1424407818 Integrated circuitsTestingCongressesSemiconductorsTestingCongressesElectronic apparatus and appliancesTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingSemiconductorsTestingElectronic apparatus and appliancesTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringIEEE Xplore (Online service)IEEE Electron Devices SocietyIEEE International Conference on Microelectronic Test StructuresPQKBPROCEEDING99101430146033212007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan2529220UNINA