Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization / / edited by Chandra Shakher Pathak and Samir Kumar
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| Titolo: |
Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization / / edited by Chandra Shakher Pathak and Samir Kumar
|
| Pubblicazione: | London : , : IntechOpen, , 2022 |
| ©2022 | |
| Descrizione fisica: | 1 online resource (xi, 274 pages) : illustrations |
| Disciplina: | 620.5 |
| Soggetto topico: | Atomic force microscopy |
| Raman spectroscopy | |
| Persona (resp. second.): | PathakChandra Shakher |
| KumarSamir | |
| Nota di bibliografia: | Includes bibliographical references. |
| Sommario/riassunto: | This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy. |
| Titolo autorizzato: | Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910688240203321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |