1.

Record Nr.

UNINA9910688240203321

Titolo

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization / / edited by Chandra Shakher Pathak and Samir Kumar

Pubbl/distr/stampa

London : , : IntechOpen, , 2022

©2022

Descrizione fisica

1 online resource (xi, 274 pages) : illustrations

Disciplina

620.5

Soggetti

Atomic force microscopy

Raman spectroscopy

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Nota di bibliografia

Includes bibliographical references.

Sommario/riassunto

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.