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100   $a20230704d2022      uy             0
101 0 $aeng
135   $aur|||||||||||
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 00$aRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization /$fedited by Chandra Shakher Pathak and Samir Kumar
210  1$aLondon :$cIntechOpen,$d2022.
210  4$dİ2022
215   $a1 online resource (xi, 274 pages) $cillustrations
311   $a1-83968-231-0 
320   $aIncludes bibliographical references.
330   $aThis book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
606   $aAtomic force microscopy
606   $aRaman spectroscopy
615  0$aAtomic force microscopy.
615  0$aRaman spectroscopy.
676   $a620.5
702   $aPathak$b Chandra Shakher
702   $aKumar$b Samir
801  0$bNjHacI
801  1$bNjHacl
906   $aBOOK
912   $a9910688240203321
996   $aRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization$92902600
997   $aUNINA