01827nam 2200397 450 991068824020332120230704122339.0(CKB)5850000000050266(NjHacI)995850000000050266(EXLCZ)99585000000005026620230704d2022 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierRecent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization /edited by Chandra Shakher Pathak and Samir KumarLondon :IntechOpen,2022.©20221 online resource (xi, 274 pages) illustrations1-83968-231-0 Includes bibliographical references.This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.Atomic force microscopyRaman spectroscopyAtomic force microscopy.Raman spectroscopy.620.5Pathak Chandra ShakherKumar SamirNjHacINjHaclBOOK9910688240203321Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization2902600UNINA