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2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE)



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Titolo: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) / / Institute of Electrical and Electronics Engineers (IEEE) Visualizza cluster
Pubblicazione: Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers (IEEE), , 2020
Descrizione fisica: 1 online resource : illustrations some color
Disciplina: 004.2
Soggetto topico: Integrated circuits - Fault tolerance
Nanotechnology
Conference papers and proceedings
Altri titoli varianti: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Titolo autorizzato: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)  Visualizza cluster
ISBN: 1-7281-9457-1
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910437213503321
Lo trovi qui: Univ. Federico II
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