Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
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| Titolo: |
Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society, 2006 |
| Disciplina: | 621.381 |
| Soggetto topico: | Integrated circuits - Testing |
| Integrated circuits - Design and construction | |
| Microelectronics - Design | |
| Microelectronics - Testing | |
| Electrical & Computer Engineering | |
| Electrical Engineering | |
| Engineering & Applied Sciences | |
| Persona (resp. second.): | GirardPatrick |
| OsseiranAdam | |
| ChewMoi-Tin | |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Titolo autorizzato: | Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia |
| ISBN: | 9781509094479 |
| 1509094474 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910145454703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |