Record Nr.

UNINA9910145454703321

Titolo

Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia

Pubbl/distr/stampa


[Place of publication not identified], : IEEE Computer Society, 2006

ISBN

9781509094479

1509094474

Disciplina

621.381

Soggetti

Integrated circuits - Testing

Integrated circuits - Design and construction

Microelectronics - Design

Microelectronics - Testing

Electrical & Computer Engineering

Electrical Engineering

Engineering & Applied Sciences

Lingua di pubblicazione

Inglese

Formato

Materiale a stampa

Livello bibliografico

Monografia

Note generali

Bibliographic Level Mode of Issuance: Monograph