02196oam 2200589zu 450 991014545470332120241212215427.097815090944791509094474(CKB)1000000000278050(SSID)ssj0000394403(PQKBManifestationID)12138339(PQKBTitleCode)TC0000394403(PQKBWorkID)10387619(PQKB)11290847(EXLCZ)99100000000027805020160829d2006 uy engtxtccrThird IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia[Place of publication not identified]IEEE Computer Society2006Bibliographic Level Mode of Issuance: Monograph9780769525006 0769525008 Integrated circuitsTestingCongressesIntegrated circuitsDesign and constructionCongressesMicroelectronicsDesignCongressesMicroelectronicsTestingCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingIntegrated circuitsDesign and constructionMicroelectronicsDesignMicroelectronicsTestingElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied Sciences621.381Girard PatrickOsseiran AdamChew Moi-TinIEEE Computer Society Technical Council on Test Technology.IEEE Malaysia SectionIEEE International Workshop on Electronic Design, Test and ApplicationsPQKBPROCEEDING9910145454703321Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia2312742UNINA