LEADER 01291nam 2200349 n 450 001 996386984903316 005 20221108085116.0 035 $a(CKB)1000000000620775 035 $a(EEBO)2240918646 035 $a(UnM)99839068 035 $a(EXLCZ)991000000000620775 100 $a19901127d1636 uy | 101 0 $aeng 135 $aurbn||||a|bb| 200 10$aSir Gyles Goose-cappe Knight$b[electronic resource] $eA comedy lately acted with great applause at the private House in Salisbury Court 210 $aLondon $cPrinted [by John Norton] for Hugh Perry, and are to be sold by Roger Ball at the golden Anchor, in the Strand neere Temple barre$d[1636] 215 $a[80] p 300 $aAttributed to George Chapman. 300 $aPrinter's name from STC. 300 $aSignatures: A² B-K⁴ L² . 300 $aA variant, probably earlier, of the edition with imprint date 1636. 300 $aReproduction of the original in the Henry E. Huntington Library and Art Gallery. 330 $aeebo-0113 700 $aChapman$b George$f1559?-1634.$0167784 801 0$bCu-RivES 801 1$bCu-RivES 801 2$bCStRLIN 801 2$bWaOLN 906 $aBOOK 912 $a996386984903316 996 $aSir Gyles Goose-cappe Knight$92352652 997 $aUNISA LEADER 02196oam 2200589zu 450 001 9910145454703321 005 20241212215427.0 010 $a9781509094479 010 $a1509094474 035 $a(CKB)1000000000278050 035 $a(SSID)ssj0000394403 035 $a(PQKBManifestationID)12138339 035 $a(PQKBTitleCode)TC0000394403 035 $a(PQKBWorkID)10387619 035 $a(PQKB)11290847 035 $a(EXLCZ)991000000000278050 100 $a20160829d2006 uy 101 0 $aeng 181 $ctxt 182 $cc 183 $acr 200 10$aThird IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia 210 31$a[Place of publication not identified]$cIEEE Computer Society$d2006 300 $aBibliographic Level Mode of Issuance: Monograph 311 08$a9780769525006 311 08$a0769525008 606 $aIntegrated circuits$xTesting$vCongresses 606 $aIntegrated circuits$xDesign and construction$vCongresses 606 $aMicroelectronics$xDesign$vCongresses 606 $aMicroelectronics$xTesting$vCongresses 606 $aElectrical & Computer Engineering$2HILCC 606 $aElectrical Engineering$2HILCC 606 $aEngineering & Applied Sciences$2HILCC 615 0$aIntegrated circuits$xTesting 615 0$aIntegrated circuits$xDesign and construction 615 0$aMicroelectronics$xDesign 615 0$aMicroelectronics$xTesting 615 7$aElectrical & Computer Engineering 615 7$aElectrical Engineering 615 7$aEngineering & Applied Sciences 676 $a621.381 702 $aGirard$b Patrick 702 $aOsseiran$b Adam 702 $aChew$b Moi-Tin 712 02$aIEEE Computer Society Technical Council on Test Technology. 712 02$aIEEE Malaysia Section 712 12$aIEEE International Workshop on Electronic Design, Test and Applications 801 0$bPQKB 906 $aPROCEEDING 912 $a9910145454703321 996 $aThird IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia$92312742 997 $aUNINA