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Advanced Computing in Electron Microscopy / / by Earl J. Kirkland



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Autore: Kirkland Earl J Visualizza persona
Titolo: Advanced Computing in Electron Microscopy / / by Earl J. Kirkland Visualizza cluster
Pubblicazione: Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020
Edizione: 3rd ed. 2020.
Descrizione fisica: 1 online resource (XII, 354 p. 146 illus., 8 illus. in color.)
Disciplina: 502.825
Soggetto topico: Spectroscopy
Microscopy
Optical data processing
Materials science
Spectroscopy and Microscopy
Image Processing and Computer Vision
Characterization and Evaluation of Materials
Biological Microscopy
Spectroscopy/Spectrometry
Nota di contenuto: Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.
Sommario/riassunto: This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
Titolo autorizzato: Advanced Computing in Electron Microscopy  Visualizza cluster
ISBN: 3-030-33260-8
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910409987503321
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