03841nam 22006135 450 991040998750332120200705234744.03-030-33260-810.1007/978-3-030-33260-0(CKB)5300000000003618(DE-He213)978-3-030-33260-0(MiAaPQ)EBC6134017(PPN)243228236(EXLCZ)99530000000000361820200309d2020 u| 0engurnn#008mamaatxtrdacontentcrdamediacrrdacarrierAdvanced Computing in Electron Microscopy /by Earl J. Kirkland3rd ed. 2020.Cham :Springer International Publishing :Imprint: Springer,2020.1 online resource (XII, 354 p. 146 illus., 8 illus. in color.)3-030-33259-4 Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.SpectroscopyMicroscopyOptical data processingMaterials scienceSpectroscopy and Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/P31090Image Processing and Computer Visionhttps://scigraph.springernature.com/ontologies/product-market-codes/I22021Characterization and Evaluation of Materialshttps://scigraph.springernature.com/ontologies/product-market-codes/Z17000Biological Microscopyhttps://scigraph.springernature.com/ontologies/product-market-codes/L26000Spectroscopy/Spectrometryhttps://scigraph.springernature.com/ontologies/product-market-codes/C11020Spectroscopy.Microscopy.Optical data processing.Materials science.Spectroscopy and Microscopy.Image Processing and Computer Vision.Characterization and Evaluation of Materials.Biological Microscopy.Spectroscopy/Spectrometry.502.825Kirkland Earl Jauthttp://id.loc.gov/vocabulary/relators/aut841699MiAaPQMiAaPQMiAaPQBOOK9910409987503321Advanced Computing in Electron Microscopy1878853UNINA