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[null,"1.","Record Nr.",null,"UNINA9910151935603321"]
[null,null,"Autore",null,"De Lellis Camillo"]
[null,null,"Titolo",null,"Rectifiable Sets, Densities, and Tangent Measures [[electronic resource] /] / Camillo De Lellis"]
[null,null,"Pubbl/distr/stampa",null,"Zuerich, Switzerland, : European Mathematical Society Publishing House, 2008"]
[null,null,"ISBN",null,"3-03719-544-4"]
[null,null,"Descrizione fisica",null,"1 online resource (133 pages)"]
[null,null,"Collana",null,"Zurich Lectures in Advanced Mathematics (ZLAM)"]
[null,null,"Classificazione",null,"28-xx26-xx49-xx"]
[null,null,"Soggetti",null,"Functional analysis"]
[{"$nulls":4},"Calculus of variations"]
[{"$nulls":4},"Measure and integration"]
[{"$nulls":4},"Real functions"]
[{"$nulls":4},"Calculus of variations and optimal control; optimization"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,null,"Sommario/riassunto","The characterization of rectifiable sets through the existence of  densities is a pearl of geometric measure theory. The difficult proof,  due to Preiss, relies on many beautiful and deep ideas and novel  techniques. Some of them have already proven useful in other contexts,  whereas others have not yet been exploited. These notes give a simple  and short presentation of the former, and provide some perspective of  the latter.    This text emerged from a course on rectifiability given at the  University of Zürich. It is addressed both to researchers and students,  the only prerequisite is a solid knowledge in standard measure theory.  The first four chapters give an introduction to rectifiable sets and  measures in euclidean spaces, covering classical topics such as the area  formula, the theorem of Marstrand and the most elementary rectifiability  criterions. The fifth chapter is dedicated to a subtle rectifiability  criterion due to Marstrand and generalized by Mattila, and the last  three focus on Preiss' result. The aim is to provide a self-contained  reference for anyone interested in an overview of this fascinating topic."]
[null,"2.","Record Nr.",null,"UNINA9910409987503321"]
[null,null,"Autore",null,"Kirkland Earl J."]
[null,null,"Titolo",null,"Advanced Computing in Electron Microscopy / / by Earl J. Kirkland"]
[null,null,"Pubbl/distr/stampa",null,"Cham : , : Springer International Publishing : , : Imprint : Springer, , 2020"]
[null,null,"ISBN",null,"3-030-33260-8"]
[null,null,"Edizione",null,"[3rd ed. 2020.]"]
[null,null,"Descrizione fisica",null,"1 online resource (XII, 354 p. 146 illus., 8 illus. in color.)"]
[null,null,"Disciplina",null,"502.825"]
[null,null,"Soggetti",null,"Spectrum analysis"]
[{"$nulls":4},"Microscopy"]
[{"$nulls":4},"Optical data processing"]
[{"$nulls":4},"Materials science"]
[{"$nulls":4},"Spectroscopy and Microscopy"]
[{"$nulls":4},"Image Processing and Computer Vision"]
[{"$nulls":4},"Characterization and Evaluation of Materials"]
[{"$nulls":4},"Biological Microscopy"]
[{"$nulls":4},"Spectroscopy/Spectrometry"]
[null,null,"Lingua di pubblicazione",null,"Inglese"]
[null,null,"Formato",null,"Materiale a stampa"]
[null,null,null,"Livello bibliografico","Monografia"]
[null,null,"Nota di contenuto",null,"Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View."]
[null,null,null,"Sommario/riassunto","This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution "]
[{"$nulls":4},"imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy."]