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010   $a3-030-33260-8
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035   $a(DE-He213)978-3-030-33260-0
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100   $a20200309d2020      u|         0
101 0 $aeng
135   $aurnn#008mamaa
181   $ctxt$2rdacontent
182   $cc$2rdamedia
183   $acr$2rdacarrier
200 10$aAdvanced Computing in Electron Microscopy /$fby Earl J. Kirkland
205   $a3rd ed. 2020.
210  1$aCham :$cSpringer International Publishing :$cImprint: Springer,$d2020.
215   $a1 online resource (XII, 354 p. 146 illus., 8 illus. in color.)
311   $a3-030-33259-4 
327   $aIntroduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.
330   $aThis updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.
606   $aSpectroscopy
606   $aMicroscopy
606   $aOptical data processing
606   $aMaterials science
606   $aSpectroscopy and Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/P31090
606   $aImage Processing and Computer Vision$3https://scigraph.springernature.com/ontologies/product-market-codes/I22021
606   $aCharacterization and Evaluation of Materials$3https://scigraph.springernature.com/ontologies/product-market-codes/Z17000
606   $aBiological Microscopy$3https://scigraph.springernature.com/ontologies/product-market-codes/L26000
606   $aSpectroscopy/Spectrometry$3https://scigraph.springernature.com/ontologies/product-market-codes/C11020
615  0$aSpectroscopy.
615  0$aMicroscopy.
615  0$aOptical data processing.
615  0$aMaterials science.
615 14$aSpectroscopy and Microscopy.
615 24$aImage Processing and Computer Vision.
615 24$aCharacterization and Evaluation of Materials.
615 24$aBiological Microscopy.
615 24$aSpectroscopy/Spectrometry.
676   $a502.825
700   $aKirkland$b Earl J$4aut$4http://id.loc.gov/vocabulary/relators/aut$0841699
801  0$bMiAaPQ
801  1$bMiAaPQ
801  2$bMiAaPQ
906   $aBOOK
912   $a9910409987503321
996   $aAdvanced Computing in Electron Microscopy$91878853
997   $aUNINA