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Fundamentals of Fluorescence Microscopy [[electronic resource] ] : Exploring Life with Light / / by Partha Pratim Mondal, Alberto Diaspro
| Fundamentals of Fluorescence Microscopy [[electronic resource] ] : Exploring Life with Light / / by Partha Pratim Mondal, Alberto Diaspro |
| Autore | Mondal Partha Pratim |
| Edizione | [1st ed. 2014.] |
| Pubbl/distr/stampa | Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 |
| Descrizione fisica | 1 online resource (XV, 218 p. 140 illus., 55 illus. in color.) |
| Disciplina | 502.82 |
| Soggetto topico |
Spectroscopy
Microscopy Biophysics Biological physics Lasers Photonics Spectroscopy and Microscopy Biological Microscopy Biological and Medical Physics, Biophysics Optics, Lasers, Photonics, Optical Devices Spectroscopy/Spectrometry |
| ISBN | 94-007-7545-8 |
| Formato | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto | Preface -- Acknowledgements -- Dedication -- Ray Optics, Wave Optics and Imaging System Designing -- Basics of Electromagnetic Theory for Fluorescence Microscopy -- Electric Field Effects in Optical Microscopy Systems -- Quantum Description of Radiation Field and Optical Microscopy -- Molecular Physics of Fluorescence Markers -- Basics of Fluorescence and Photophysics -- General Fluorescence Imaging Techniques -- Multiphoton Fluorescence Microscopy -- Super Resolution Fluorescence Microscopy -- Image Reconstruction Methodologies for Fluorescence Microscopy -- Future Prospective of Fluorescence Microscopy -- Appendix I -- Appendix II -- Appendix III. |
| Record Nr. | UNINA-9910300370703321 |
Mondal Partha Pratim
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| Dordrecht : , : Springer Netherlands : , : Imprint : Springer, , 2014 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Fusion methods in chemical microscopy / Walter C. McCrone, jr
| Fusion methods in chemical microscopy / Walter C. McCrone, jr |
| Autore | McCrone, Walter C. <jr.> |
| Pubbl/distr/stampa | New York ; London, : Interscience Publishers, ©1957 |
| Descrizione fisica | VII, 307 p., [5] carte di tav. : ill. ; 24 cm |
| Disciplina | 502.82 |
| Soggetto non controllato | Microscopia chimica |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-9910841989203321 |
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McCrone, Walter C. <jr.>
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| New York ; London, : Interscience Publishers, ©1957 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Gas-Phase IR Spectroscopy and Structure of Biological Molecules / editors Anouk M. Rijs, Jos Oomens ; with contributions by J.L. Alonso
| Gas-Phase IR Spectroscopy and Structure of Biological Molecules / editors Anouk M. Rijs, Jos Oomens ; with contributions by J.L. Alonso |
| Pubbl/distr/stampa | Cham, : Springer, 2015 |
| Descrizione fisica | IX, 406 p. : ill. ; 24 cm |
| Disciplina |
572(Biochimica. Citochimica. Istochimica)
540(Chimica generale) 541(Chimica fisica) 543.65(Spettrometria di massa. Spettroscopia di massa) 502.82(Microscopia) 571.4(Biofisica) 610.153(Fisica medica) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN0241977 |
| Cham, : Springer, 2015 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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Handbook of biological confocal microscopy / Editor James B. Pawley
| Handbook of biological confocal microscopy / Editor James B. Pawley |
| Edizione | [3th ed.] |
| Pubbl/distr/stampa | New York, : Springer, c2006 |
| Descrizione fisica | XXVIII, 985 p. : ill. ; 29 cm |
| Disciplina |
578.45
502.82 |
| Soggetto non controllato | Biologia - Microscopia Confocale |
| ISBN | 0-387-25921-X |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990008503780403321 |
| New York, : Springer, c2006 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of Materials Characterization / Surender Kumar Sharma editor
| Handbook of Materials Characterization / Surender Kumar Sharma editor |
| Pubbl/distr/stampa | Cham, : Springer, 2018 |
| Descrizione fisica | VIII, 613 p. : ill. ; 24 cm |
| Disciplina |
543(Chimica analitica)
543.54(Spettroscopia molecolare) 502.82(Microscopia) 620.11(Materiali dell'ingegneria) 620.1(Scienze dei materiali) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-VAN0125755 |
| Cham, : Springer, 2018 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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Handbook of Materials Characterization / Surender Kumar Sharma editor
| Handbook of Materials Characterization / Surender Kumar Sharma editor |
| Edizione | [Cham : Springer, 2018] |
| Pubbl/distr/stampa | VIII, 613 p., : ill. ; 24 cm |
| Descrizione fisica | Pubblicazione in formato elettronico |
| Disciplina |
543(Chimica analitica)
543.54(Spettroscopia molecolare) 502.82(Microscopia) 620.11(Materiali dell'ingegneria) 620.1(Scienza dei materiali) |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNICAMPANIA-SUN0125755 |
| VIII, 613 p., : ill. ; 24 cm | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Vanvitelli | ||
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Handbook of microscopy / Marcel Locquin and Maurice Langeron ; translation edited by Harold Hillman
| Handbook of microscopy / Marcel Locquin and Maurice Langeron ; translation edited by Harold Hillman |
| Autore | Locquin, Marcel |
| Pubbl/distr/stampa | London [etc.] : Butterworths, 1983 |
| Descrizione fisica | XII, 322 p. : ill. ; 25 cm. |
| Disciplina | 502.82 |
| Altri autori (Persone) | Langeron, Maurice |
| Soggetto topico | Microscopia |
| ISBN | 0-408-10679-4 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNIBAS-000010917 |
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Locquin, Marcel
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| London [etc.] : Butterworths, 1983 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. della Basilicata | ||
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Handbook of microscopy [Risorsa elettronica] : applications in materials science, solid-state physics, and chemistry / edited by S. Amelinckx ... [et al.]
| Handbook of microscopy [Risorsa elettronica] : applications in materials science, solid-state physics, and chemistry / edited by S. Amelinckx ... [et al.] |
| Pubbl/distr/stampa | Weinheim ; New York : VCH, 1997 |
| Descrizione fisica | 3 v. |
| Disciplina | 502.82 |
| Soggetto non controllato | Microscopia |
| ISBN | 9783527619283 |
| Formato | Risorse elettroniche  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Record Nr. | UNINA-990009802290403321 |
| Weinheim ; New York : VCH, 1997 | ||
| Risorse elettroniche | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of nanoscopy [[electronic resource] /] / edited by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycock
| Handbook of nanoscopy [[electronic resource] /] / edited by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycock |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, 2012 |
| Descrizione fisica | 1 online resource (1449 p.) |
| Disciplina | 502.82 |
| Altri autori (Persone) |
TendelooG. Van (Gustaaf)
Van DyckDirk PennycockStephen J |
| Soggetto topico |
Microscopy
Nanotechnology |
| ISBN |
3-527-64187-4
1-283-64414-2 3-527-64188-2 3-527-64186-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Nanoscopy; 33.9 Conclusions and Future Directions; Contents to Volume; Preface; List of Contributors; The Past, the Present, and the Future of Nanoscopy; Part I Methods; 1 Transmission Electron Microscopy; 1.1 Introduction; 1.2 The Instrument; 1.2.1 General Layout; 1.2.2 Lenses and Lens Aberrations; 1.3 Imaging and Diffraction Modes; 1.3.1 Important Diffraction Geometries; 1.3.2 Important Imaging Modes; 1.4 Dynamical Diffraction Theory; 1.4.1 Perfect Crystal Theory; 1.4.1.1 Fourier Space Approach; 1.4.1.2 Real-Space Approach; 1.4.1.3 Bloch Wave Approach
1.4.2 Example Dynamical Computations1.4.2.1 Analytical Two-Beam Solutions; 1.4.2.2 Numerical Multibeam Approaches; 1.4.2.3 Other Dynamical Scattering Phenomena; 1.4.3 Defect Images; 1.4.3.1 Theory; 1.4.3.2 Defect Image Simulations; References; 2 Atomic Resolution Electron Microscopy; 2.1 Introduction; 2.1.1 Atoms: the Alphabet of Matter; 2.1.2 The Ideal Experiment; 2.1.3 Why Imaging?; 2.1.4 Why Electron Microscopy?; 2.2 Principles of Linear Image Formation; 2.2.1 Real Imaging; 2.2.2 Coherent Imaging; 2.3 Imaging in the Electron Microscope; 2.3.1 Theory of Abbe; 2.3.2 Incoherent Effects 2.3.3 Imaging at Optimum Defocus: Phase Contrast Microscopy2.3.4 Resolution; 2.4 Experimental HREM; 2.4.1 Aligning the Microscope; 2.4.2 The Specimen; 2.4.3 Interpretation of the High-Resolution Images; 2.5 Quantitative HREM; 2.5.1 Model-Based Fitting; 2.5.2 Phase Retrieval; 2.5.3 Exit Wave Reconstruction; 2.5.4 Structure Retrieval: Channeling Theory; 2.5.5 Resolving versus Refining; Appendix 2.A: Interaction of the Electron with a Thin Object; Appendix 2.B: Multislice Method; Appendix 2.C: Quantum Mechanical Approach; References 3 Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration3.1 Introduction; 3.2 The Principles of Atomic-Resolution Imaging; 3.2.1 Resolution and Point Spread; 3.2.2 Contrast; 3.2.3 Enhanced Contrast under Negative Spherical Aberration Conditions; 3.2.4 NCSI Imaging for Higher Sample Thicknesses; 3.3 Inversion of the Imaging Process; 3.4 Case Study: SrTiO3; 3.5 Practical Examples of Application of NCSI Imaging; References; 4 Z-Contrast Imaging; 4.1 Recent Progress; 4.2 Introduction to the Instrument; 4.3 Imaging in the STEM; 4.3.1 Probe Formation 4.3.2 The Ronchigram4.3.3 Reciprocity between TEM and STEM; 4.3.4 Coherent and Incoherent Imaging; 4.3.5 Dynamical Diffraction; 4.3.6 Depth Sectioning; 4.3.7 Image Simulation and Quantification; 4.4 Future Outlook; Acknowledgments; References; 5 Electron Holography; General Idea; 5.1 Image-Plane Off-Axis Holography Using the Electron Biprism; 5.1.1 Recording a Hologram; 5.1.2 Reconstruction of the Electron Wave; 5.2 Properties of the Reconstructed Wave; 5.2.1 Time Averaging; 5.2.2 Inelastic Filtering; 5.2.3 Basis for Recovering the Object Exit Wave; 5.2.4 Amplitude Image; 5.2.5 Phase Image 5.2.6 Field of View |
| Record Nr. | UNINA-9910133837303321 |
| Weinheim, : Wiley-VCH, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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Handbook of nanoscopy [[electronic resource] /] / edited by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycock
| Handbook of nanoscopy [[electronic resource] /] / edited by Gustaaf van Tendeloo, Dirk Van Dyck, and Stephen J. Pennycock |
| Edizione | [1st ed.] |
| Pubbl/distr/stampa | Weinheim, : Wiley-VCH, 2012 |
| Descrizione fisica | 1 online resource (1449 p.) |
| Disciplina | 502.82 |
| Altri autori (Persone) |
TendelooG. Van (Gustaaf)
Van DyckDirk PennycockStephen J |
| Soggetto topico |
Microscopy
Nanotechnology |
| ISBN |
3-527-64187-4
1-283-64414-2 3-527-64188-2 3-527-64186-6 |
| Formato | Materiale a stampa |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione | eng |
| Nota di contenuto |
Handbook of Nanoscopy; 33.9 Conclusions and Future Directions; Contents to Volume; Preface; List of Contributors; The Past, the Present, and the Future of Nanoscopy; Part I Methods; 1 Transmission Electron Microscopy; 1.1 Introduction; 1.2 The Instrument; 1.2.1 General Layout; 1.2.2 Lenses and Lens Aberrations; 1.3 Imaging and Diffraction Modes; 1.3.1 Important Diffraction Geometries; 1.3.2 Important Imaging Modes; 1.4 Dynamical Diffraction Theory; 1.4.1 Perfect Crystal Theory; 1.4.1.1 Fourier Space Approach; 1.4.1.2 Real-Space Approach; 1.4.1.3 Bloch Wave Approach
1.4.2 Example Dynamical Computations1.4.2.1 Analytical Two-Beam Solutions; 1.4.2.2 Numerical Multibeam Approaches; 1.4.2.3 Other Dynamical Scattering Phenomena; 1.4.3 Defect Images; 1.4.3.1 Theory; 1.4.3.2 Defect Image Simulations; References; 2 Atomic Resolution Electron Microscopy; 2.1 Introduction; 2.1.1 Atoms: the Alphabet of Matter; 2.1.2 The Ideal Experiment; 2.1.3 Why Imaging?; 2.1.4 Why Electron Microscopy?; 2.2 Principles of Linear Image Formation; 2.2.1 Real Imaging; 2.2.2 Coherent Imaging; 2.3 Imaging in the Electron Microscope; 2.3.1 Theory of Abbe; 2.3.2 Incoherent Effects 2.3.3 Imaging at Optimum Defocus: Phase Contrast Microscopy2.3.4 Resolution; 2.4 Experimental HREM; 2.4.1 Aligning the Microscope; 2.4.2 The Specimen; 2.4.3 Interpretation of the High-Resolution Images; 2.5 Quantitative HREM; 2.5.1 Model-Based Fitting; 2.5.2 Phase Retrieval; 2.5.3 Exit Wave Reconstruction; 2.5.4 Structure Retrieval: Channeling Theory; 2.5.5 Resolving versus Refining; Appendix 2.A: Interaction of the Electron with a Thin Object; Appendix 2.B: Multislice Method; Appendix 2.C: Quantum Mechanical Approach; References 3 Ultrahigh-Resolution Transmission Electron Microscopy at Negative Spherical Aberration3.1 Introduction; 3.2 The Principles of Atomic-Resolution Imaging; 3.2.1 Resolution and Point Spread; 3.2.2 Contrast; 3.2.3 Enhanced Contrast under Negative Spherical Aberration Conditions; 3.2.4 NCSI Imaging for Higher Sample Thicknesses; 3.3 Inversion of the Imaging Process; 3.4 Case Study: SrTiO3; 3.5 Practical Examples of Application of NCSI Imaging; References; 4 Z-Contrast Imaging; 4.1 Recent Progress; 4.2 Introduction to the Instrument; 4.3 Imaging in the STEM; 4.3.1 Probe Formation 4.3.2 The Ronchigram4.3.3 Reciprocity between TEM and STEM; 4.3.4 Coherent and Incoherent Imaging; 4.3.5 Dynamical Diffraction; 4.3.6 Depth Sectioning; 4.3.7 Image Simulation and Quantification; 4.4 Future Outlook; Acknowledgments; References; 5 Electron Holography; General Idea; 5.1 Image-Plane Off-Axis Holography Using the Electron Biprism; 5.1.1 Recording a Hologram; 5.1.2 Reconstruction of the Electron Wave; 5.2 Properties of the Reconstructed Wave; 5.2.1 Time Averaging; 5.2.2 Inelastic Filtering; 5.2.3 Basis for Recovering the Object Exit Wave; 5.2.4 Amplitude Image; 5.2.5 Phase Image 5.2.6 Field of View |
| Record Nr. | UNINA-9910827816203321 |
| Weinheim, : Wiley-VCH, 2012 | ||
| Materiale a stampa | ||
| Lo trovi qui: Univ. Federico II | ||
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