DFT : 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 8-10 October 2018, Chicago, IL, USA / / Institute of Electrical and Electronics Engineers
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| Titolo: |
DFT : 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 8-10 October 2018, Chicago, IL, USA / / Institute of Electrical and Electronics Engineers
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| Pubblicazione: | Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
| Descrizione fisica: | 1 online resource (980 pages) |
| Disciplina: | 621.395 |
| Soggetto topico: | Integrated circuits - Very large scale integration |
| Nanotechnology | |
| Titolo autorizzato: | DFT |
| ISBN: | 1-5386-8398-9 |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 996575607803316 |
| Lo trovi qui: | Univ. di Salerno |
| Opac: | Controlla la disponibilità qui |