01279nam 2200361 450 99657560780331620230817191314.01-5386-8398-9(CKB)4100000007451936(WaSeSS)IndRDA00122292(EXLCZ)99410000000745193620200423d2019 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrierDFT 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 8-10 October 2018, Chicago, IL, USA /Institute of Electrical and Electronics EngineersPiscataway, New Jersey :Institute of Electrical and Electronics Engineers,2019.1 online resource (980 pages)1-5386-8399-7 Integrated circuitsVery large scale integrationCongressesNanotechnologyCongressesIntegrated circuitsVery large scale integrationNanotechnology621.395Institute of Electrical and Electronics Engineers,WaSeSSWaSeSSPROCEEDING996575607803316DFT2505108UNISA