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Record Nr. |
UNISA996575607803316 |
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Titolo |
DFT : 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems : 8-10 October 2018, Chicago, IL, USA / / Institute of Electrical and Electronics Engineers |
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Pubbl/distr/stampa |
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Piscataway, New Jersey : , : Institute of Electrical and Electronics Engineers, , 2019 |
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ISBN |
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Descrizione fisica |
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1 online resource (980 pages) |
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Disciplina |
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Soggetti |
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Integrated circuits - Very large scale integration |
Nanotechnology |
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Lingua di pubblicazione |
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Formato |
Materiale a stampa |
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Livello bibliografico |
Monografia |
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