Measurement techniques for high power semiconductor materials and devices : annual report, October 1, 1979 to September 30, 1980 / / R. C. Larrabee; W. E. Phillips; W. R. Thurber

• Autore: Larrabee R. C (Ralph C.)
• Pubblicazione: Gaithersburg, MD : , : U.S. Dept. of Commerce, National Institute of Standards and Technology, , 1981
• Descrizione fisica: 1 online resource
• Altri autori: LarrabeeR. C (Ralph C.) PhillipsW. E ThurberW. Robert
• Note generali: 1981.; Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.; Title from PDF title page.
• Nota di bibliografia: Includes bibliographical references.
• Altri titoli varianti: Measurement techniques for high power semiconductor materials and devices
• Titolo autorizzato: Measurement techniques for high power semiconductor materials and devices
• Formato: Materiale a stampa
• Livello bibliografico: Monografia
• Lingua di pubblicazione: Inglese
• Record Nr.: 9910710273303321
• Lo trovi qui: Univ. Federico II