DFT 2005: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (03-05 October 2005/Monterey, CA)
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| Autore: |
Aitken Robert
|
| Titolo: |
DFT 2005: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (03-05 October 2005/Monterey, CA)
|
| Pubblicazione: | [Place of publication not identified], : IEEE Computer Society Press, 2005 |
| Descrizione fisica: | 1 online resource (xii, 602 pages) : illustrations |
| Disciplina: | 004.2 |
| Soggetto topico: | Fault-tolerant computing |
| Note generali: | Bibliographic Level Mode of Issuance: Monograph |
| Sommario/riassunto: | Annotation DFT 2005 showcases the latest research results on yield analysis and modeling, scan design and test data compression, reconfiguration, error correcting codes and circuits, and fault detection and tolerance for sensor and flash memory. Its also covers delay fault test and timing consideration, interconnect test, approaches for soft error, on-line and concurrent fault detection, fault and error tolerant systems, and test scheduling and software-based test. |
| Titolo autorizzato: | DFT 2005: 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (03-05 October 2005 |
| ISBN: | 9781538602904 |
| 1538602903 | |
| Formato: | Materiale a stampa  |
| Livello bibliografico | Monografia |
| Lingua di pubblicazione: | Inglese |
| Record Nr.: | 9910142311703321 |
| Lo trovi qui: | Univ. Federico II |
| Opac: | Controlla la disponibilità qui |