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Scanning electron microscopy / / Viacheslav Kazmiruk



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Autore: Kazmiruk Viacheslav Visualizza persona
Titolo: Scanning electron microscopy / / Viacheslav Kazmiruk Visualizza cluster
Pubblicazione: IntechOpen, 2012
[Place of publication not identified] : , : IntechOpen, , 2012
©2012
Edizione: 1st ed.
Descrizione fisica: 1 online resource (848 pages)
Soggetto topico: TECHNOLOGY & ENGINEERING / Electronics / Optoelectronics
Soggetto non controllato: Physical Sciences
Engineering and Technology
Optoelectronics
Physics
Optics and Lasers
Sommario/riassunto: Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging but quantitative measurement of object topologies, local electrophysical characteristics of semiconductor structures and performing elemental analysis. Moreover, a fine focused e-beam is widely used for the creation of micro and nanostructures. The book's approach covers both theoretical and practical issues related to scanning electron microscopy. The book has 41 chapters, divided into six sections: Instrumentation, Methodology, Biology, Medicine, Material Science, Nanostructured Materials for Electronic Industry, Thin Films, Membranes, Ceramic, Geoscience, and Mineralogy. Each chapter, written by different authors, is a complete work which presupposes that readers have some background knowledge on the subject.
Titolo autorizzato: Scanning electron microscopy  Visualizza cluster
ISBN: 953-51-4329-8
Formato: Materiale a stampa
Livello bibliografico Monografia
Lingua di pubblicazione: Inglese
Record Nr.: 9910137698703321
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